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Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

Investigation of the joint condition and joining methods of crimp terminals, as well as the types of materials! Introduction to cross-sectional observation and elemental analysis using SEM/EDX.

I would like to introduce the topic of "Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX." We conducted cross-section preparation of the joint area of a copper crimp terminal fixture for resistance measurement, applied chemical etching to the prepared cross-section, and observed the metal structure before and after etching. As a result, we infer that the detected elements are P (phosphorus), Ag (silver), and Cu (copper), indicating that it is a silver-containing phosphorus copper soldering material. *For more details, please refer to the PDF document or feel free to contact us.*

  • Analysis and prediction system
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Analysis of trace metal elements in liquid crystals

Depending on the panel size, it is possible to analyze using different ICP-AES/MS devices!

We will introduce a case where ICP measurement was conducted using panels before and after reliability testing, and quantification was performed. The liquid crystal molecules in an LCD are oriented within the panel, and the display is controlled by changes in the orientation state of the liquid crystal due to voltage. When ionic substances, such as metal elements, are present inside the panel, the liquid crystal does not operate correctly, leading to display defects. It is known that ionic substances can increase due to contamination during manufacturing or long-term use, making it important to quantify and understand them as part of panel quality. Metal ions can be quantitatively analyzed using ICP analysis, and depending on the differences in pretreatment methods and detection sensitivity, ICP-AES/MS is used selectively. [Analysis Content] ■ Comparison of metal element content using ICP-AES analysis ■ Comparison of metal element content using ICP-MS analysis *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment

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